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Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry

✍ Scribed by Kim, Seung Hwan ;Lee, Seoung Hun ;Lim, Jae In ;Kim, Kyong Hon


Book ID
115354920
Publisher
The Optical Society
Year
2010
Tongue
English
Weight
432 KB
Volume
49
Category
Article
ISSN
1559-128X

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