Interferometric study of transient diffusion layers

✍ Scribed by F.R. McLarnon; R.H. Muller; C.W. Tobias

• Book ID: 103065091
• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 579 KB
• Volume: 21
• Category: Article
• ISSN: 0013-4686
• DOI: 10.1016/0013-4686(76)85045-1

✦ Synopsis

Transient refractive-index fields in stagnant CuSO, solutions were measured by double beam interfcrometry during the galvanostatic deposition of copper. Concentration profiles in the electrolyte have been derived from the interferograms by correcting for optical aberrations caused by beam deflection and reflection. The time-dependent concentration profiles are in good agreement with those derived from a soIution of the diffusion equation in which the concentration dependence of diffusivity is taken into account. NOMENCLATURE electrolyte concentration (M CuSO,) hulk dectroLyte concentration (M CuSO,) diffusion coefficient (cm'/s) diffusion coefficient at C = 0 (cm'/4 Faraday constant (coul/equivalent) current density (mA/cm') phase change (fringes) time after beginning of electrolysis (s) cation transference number distance from electrode surface (mm) cation valence constant (equation ( 6)) constant (equation ( 7)) A@ anode potential minus cathode potential (V)