Transient refractive-index fields in stagnant CuSO, solutions were measured by double beam interfcrometry during the galvanostatic deposition of copper. Concentration profiles in the electrolyte have been derived from the interferograms by correcting for optical aberrations caused by beam deflection
โฆ LIBER โฆ
Interferometric investigation of near-membrane diffusion layers
โ Scribed by K. Dworecki
- Book ID
- 104894351
- Publisher
- Springer Netherlands
- Year
- 1995
- Tongue
- English
- Weight
- 824 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0092-0606
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