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Interfacial reaction and solder joint reliability of Pb-free solders in lead frame chip scale packages (LF-CSP)

✍ Scribed by Seung Wook Yoon; Chang Jun Park; Sung Hak Hong; Jong Tae Moon; Ik Seong Park; Heung Sup Chun


Publisher
Springer US
Year
2000
Tongue
English
Weight
508 KB
Volume
29
Category
Article
ISSN
0361-5235

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