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Interfacial analysis of aluminum and copper thin films evaporated on polyethylene-terephthalate

✍ Scribed by J.F. Silvain; J.J. Ehrhardt; P. Lutgen

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 966 KB
Volume: 195
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(91)90289-a

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