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Interface thermal resistance of nanostructured FeCoCu film and Si substrate

✍ Scribed by Yuri M. Nikolaenko; Yuri V. Medvedev; Yuri A. Genenko; Mohammad Ghafari; Horst Hahn

Book ID
104557878
Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
225 KB
Volume
3
Category
Article
ISSN
1862-6351

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Thermal conductivity and interface therm
Thermal conductivity and interface thermal resistance of Si film on Si substrate determined by photothermal displacement interferometry
✍ B. S. W. Kuo; J. C. M. Li; A. W. Schmid πŸ“‚ Article πŸ“… 1992 πŸ› Springer 🌐 English βš– 860 KB

An in situ, noncontact, photothermal displacement interferometer for performing thermal diffusivity measurements on bulk and thin-fihn materials has been developed. Localized transient surface motion is generated through photothermoelastic coupling of a pulsed, heating laser beam to the sample under