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Interface states in the Si band-gap obtained from XPS measurements under biases

✍ Scribed by H. Kobayashi; K. Namba; Y. Yamashita; Y. Nakato; Y. Nishioka

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Energy distribution of surface states in

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New method for determination of energy d

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Dependence of interface states in the Si

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The role of interface states in the eval

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The determination of the interface-state

✍ E. Ayyildiz; Ç. Nuho Lu; A Türüt 📂 Article 📅 2002 🏛 Springer US 🌐 English ⚖ 799 KB