✦ LIBER ✦

Interface Separation in Residually-Stressed Thin-Film Structures

✍ Scribed by Sven Strohband; Reinhold H. Dauskardt

Book ID: 111549316
Publisher: Springer
Year: 2003
Tongue: English
Weight: 144 KB
Volume: 11
Category: Article
ISSN: 0927-7056
DOI: 10.1023/a:1025196306794

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Interfaces and stresses in thin films

✍ F Spaepen 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 523 KB

Measurement of adherence of residually s

Measurement of adherence of residually stressed thin films by indentation. I. Mechanics of interface delamination

✍ Marshall, D. B.; Evans, A. G. 📂 Article 📅 1984 🏛 American Institute of Physics 🌐 English ⚖ 787 KB

Assumptions in Thin Film Residual Stress

Assumptions in Thin Film Residual Stress Methods

✍ Vermeulen, Arnold C. 📂 Article 📅 2002 🏛 Trans Tech Publications, Ltd. 🌐 English ⚖ 406 KB

interfaces in thin-film multilayer struc

interfaces in thin-film multilayer structures

✍ Hebard, A. F.; Eom, C. B.; Iwasa, Y.; Lyons, K. B.; Thomas, G. A.; Rapkine, D. H 📂 Article 📅 1994 🏛 The American Physical Society 🌐 English ⚖ 272 KB

Interface stress at thin film semiconduc

Interface stress at thin film semiconductor heterostructures

✍ Taneo Nishino 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 123 KB

Nanoparticulate origin of intrinsic resi

Nanoparticulate origin of intrinsic residual stress in thin films

✍ G. Guisbiers; O. Van Overschelde; M. Wautelet 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 176 KB

The formation of grains in thin films generates intrinsic residual stress. In this work, we present a model of intrinsic residual stress calculation based on the size-dependent phase transitions of the nanograins. Evaporated thin films are produced by condensation from the vapor on the substrate. It