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Interface roughness and charge carrier recombination lifetimes in GaInAs/InP quantum wells grown by LP-MOVPE

✍ Scribed by M. Engel; R.K. Bauer; D. Bimberg; D. Grützmacher; H. Jürgensen


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
490 KB
Volume
93
Category
Article
ISSN
0022-0248

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