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Interface properties of hydrogenated amorphous carbon films on SiO2 and SiO1.2: an in situ photoelectron study

✍ Scribed by S. Schelz; P. Oelhafen

Publisher: Elsevier Science
Year: 1992
Weight: 60 KB
Volume: 279
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(92)90214-p

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