ToF-SIMS studies of the adsorption of ep
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Acharawan Rattana; Marie-Laure Abel; John F. Watts
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Article
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2006
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Elsevier Science
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English
⚖ 507 KB
Time of flight secondary ion mass spectrometry (ToF-SIMS) has been employed for the study of the adsorption of epoxy resin molecules, diglycidyl ether of bisphenol A (DGEBA), on aluminium substrates treated with an organosilane, g-glycidoxypropyltrimethoxysilane (GPS). Both the kinetics of adsorptio