Samples consisting of (\mathrm{Ag}) fine particles (4 \mathrm{~nm}) in size placed near to an Al surface were prepared by depositing (\mathrm{Ag}-\mathrm{SiO}{2}) composite films by a rf cosputtering method onto vacuum-evaporated Al films. Angle-scan attenuated total reflection (ATR) measurements were performed over a wide wavelength range ( (\lambda=350-630 \mathrm{~nm}) ) covering the resonance region ((\lambda-410 \mathrm{~nm})) of localized surface plasmon (LSP) in the Ag particles. It was found that the existence of (\mathrm{Ag}) fine particles near to the (\mathrm{Al}) surface led to a deformation of the dispersion curve of the surface plasmon polariton (SPP) propagating on the Al surface, in particular, in the LSP resonance region. The interaction between LSP and SPP was found to become much stronger as the distance between the particles and the surface decreases. The theoretical calculations based on the effective medium theory, which gave an effective dielectric function of the (\mathrm{Ag}-\mathrm{SiO}{2}) composite film, reproduced the deformation of the dispersion curve of the SPP. The deformation of the dispersion observed experimentally was qualitatively explained by the behavior of the effective dielectric function of the (\mathrm{Ag})-SiO2 composite film.