Intensity-following ellipsometry of passive films on iron
β Scribed by Rokuro Nishimura; Kiyokatsu Kudo; Norio Sato
- Publisher
- Elsevier Science
- Year
- 1980
- Weight
- 67 KB
- Volume
- 96
- Category
- Article
- ISSN
- 0167-2584
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Ahatraet-Impedance measurements have been combined with ellipsometric measurements. The optical properties change with varying potential due to the formation of a thin layer or to changes in the composition of the passive f&t. This combination of techniques can, therefore, give more insight into the
The growth of passive film on iron has been traced during potential sweep at various sweep rates in a neutral borate solution at pH 8.4. The transient thickness increase from a stationary state at 0.0 V (vs. Ag-AgC1) was measured by automated ellipsometry by which the ellipsometric parameters β’ and