๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Integrated control circuit for adaptive sampling

โœ Scribed by Rieger, Robert; Nian, Shu-Han

Book ID
113060717
Publisher
Springer
Year
2011
Tongue
English
Weight
706 KB
Volume
72
Category
Article
ISSN
0925-1030

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Photoemission sampling technique for hig
Photoemission sampling technique for high-speed integrated-circuit testing
โœ H. Beha; H. Seitz; A. Blacha; R. Clauberg ๐Ÿ“‚ Article ๐Ÿ“… 1987 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 468 KB

After a short review of the basic principles of time-resolved photoemission and its capabilities as a method for contactless electrical testing of integrated circuits, this paper reports on the progress made toward meeting the requirements for integrated-circuit (IC) testing and diagnostic equipment