๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

A custom integrated circuit comparator for high-performance sampling applications

โœ Scribed by Laug, O.B.; Souders, T.M.; Flach, D.R.


Book ID
114542542
Publisher
IEEE
Year
1992
Tongue
English
Weight
604 KB
Volume
41
Category
Article
ISSN
0018-9456

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After a short review of the basic principles of time-resolved photoemission and its capabilities as a method for contactless electrical testing of integrated circuits, this paper reports on the progress made toward meeting the requirements for integrated-circuit (IC) testing and diagnostic equipment