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Insulated gate bipolar transistor reliability testing protocol for PV inverter applications

✍ Scribed by Flicker, Jack; Kaplar, Robert; Yang, Benjamin; Marinella, Matthew; Granata, Jennifer

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

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✍ Case, M.J.; Schoeman, J.J.; Blajszczak, G.; van Wyk, J.D. 📂 Article 📅 1994 🏛 IEEE ⚖ 399 KB

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✍ Biswas, S.K.; Basak, B.; Rajashekara, K.S. 📂 Article 📅 1991 🏛 IEEE ⚖ 473 KB