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Instrumentation for fast in-situ X-ray structure measurements on non-equilibrium liquids

✍ Scribed by J.K.R. Weber; C.J. Benmore; G. Jennings; M.C. Wilding; J.B. Parise

Book ID
103860016
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
224 KB
Volume
624
Category
Article
ISSN
0168-9002

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## Abstract In situ X‐ray examination at a synchrotron beamline of the solution growth of self‐assembled SiGe structures on silicon (001) substrates through the backside has been realized by a specific heating equipment and a suitable growth assembly. The furnace allows heating of the growth assemb