✦ LIBER ✦
Novel system for X-ray CTR scattering measurement on in-situ observation of OMVPE growth of nitride semiconductor heterostructures
✍ Scribed by Koji Ninoi; Guang Xu Ju; Hajime Kamiya; Shingo Fuchi; Masao Tabuchi; Yoshikazu Takeda
- Book ID
- 108166216
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 798 KB
- Volume
- 318
- Category
- Article
- ISSN
- 0022-0248
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