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[Inst. Electr. Eng. Japan 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) 2001 Asia Conference on Electrical Insulation Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems - Himeji, Japan (19-22 Nov. 2001)] Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001). 2001 Asian Conference on Electrical Insulating Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in System - Partial discharge pattern recognition using fractal dimension

✍ Scribed by Li Jian, ; Sun Caixin, ; Li Xin, ; Du Lin, ; Zhou Quan,

Book ID: 118019610
Publisher: Inst. Electr. Eng. Japan
Year: 2001
Weight: 354 KB
Volume: 0
Category: Article
ISBN-13: 9784886860538
DOI: 10.1109/iseim.2001.973586

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