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[Inst. Electr. Eng. Japan 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) 2001 Asia Conference on Electrical Insulation Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems - Himeji, Japan (19-22 Nov. 2001)] Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001). 2001 Asian Conference on Electrical Insulating Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in System - Time-lag measurement of void discharges and numerical simulation for clarification of the factor for partial discharge pattern

โœ Scribed by Hozumi, N.; Nagae, H.; Muramoto, Y.; Nagao, M.; HengKyun Xie,


Book ID
118018894
Publisher
Inst. Electr. Eng. Japan
Year
2001
Weight
363 KB
Volume
0
Category
Article
ISBN-13
9784886860538

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