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[Inst. Electr. Eng. Japan 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 - Osaka, Japan (4-7 June 2001)] Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216) - Soft-switching turn-off characterization at high temperature of 1200 V trench IGBT using local lifetime control

✍ Scribed by Azzopardi, S.; Kawamura, A.; Iwamoto, H.

Book ID: 121652262
Publisher: Inst. Electr. Eng. Japan
Year: 2001
Tongue: Japanese
Weight: 456 KB
Category: Article
ISBN-13: 9784886860569
DOI: 10.1109/ISPSD.2001.934619

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