Input power induced thermal effects related to transition time between avalanche and second breakdown in p-n silicon junctions

✍ Scribed by Ferry, D.K.; Dougal, A.A.

• Book ID: 114589020
• Publisher: IEEE
• Year: 1966
• Tongue: English
• Weight: 423 KB
• Volume: ED-13
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1966.15748