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Input and reverse transfer capacitance measurement of MOS-gated power transistors under high current flow

✍ Scribed by Deml, C.

Book ID: 117865085
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 160 KB
Volume: 37
Category: Article
ISSN: 0093-9994
DOI: 10.1109/28.936397

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[IEEE 34th Annual Meeting of the IEEE Industry Applications - Phoenix, AZ, USA (3-7 Oct. 1999)] Conference Record of the 1999 IEEE Industry Applications Conference. Thirty-Forth IAS Annual Meeting (Cat. No.99CH36370) - Input and reverse transfer capacitance measurement of MOS-gated power transistors under high current flow

✍ Deml, C. 📂 Article 📅 1999 🏛 IEEE ⚖ 384 KB