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[IEEE 34th Annual Meeting of the IEEE Industry Applications - Phoenix, AZ, USA (3-7 Oct. 1999)] Conference Record of the 1999 IEEE Industry Applications Conference. Thirty-Forth IAS Annual Meeting (Cat. No.99CH36370) - Input and reverse transfer capacitance measurement of MOS-gated power transistors under high current flow

✍ Scribed by Deml, C.

Book ID: 111973413
Publisher: IEEE
Year: 1999
Weight: 384 KB
Volume: 2
Category: Article
ISBN-13: 9780780355897
DOI: 10.1109/ias.1999.801640

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