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Injected carrier concentrations in diffused silicon transistors by observation of interband carrier recombination

✍ Scribed by Chaplin, N.J.

Book ID: 114588499
Publisher: Institute of Electrical and Electronics Engineers
Year: 1962
Tongue: English
Weight: 372 KB
Volume: 9
Category: Article
ISSN: 0096-2430
DOI: 10.1109/t-ed.1962.14903

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