๐”– Bobbio Scriptorium
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On the simultaneous determination of lifetime, diffusivity and surface recombination velocity of injected carriers in semiconductors by the Flying Spot Method

โœ Scribed by J. Gyulai


Book ID
112999923
Publisher
Springer-Verlag
Year
1960
Weight
141 KB
Volume
12
Category
Article
ISSN
0001-6705

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Influence of grain boundary recombinatio
โœ C.A. Dimitriadis ๐Ÿ“‚ Article ๐Ÿ“… 1985 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 215 KB

The effective minority carrier lifetime in polycrystalline semiconductors is determined in terms of the grain size and the recombination velocity at the grain boundaries. The effect of the grain boundaries is to reduce the effective lifetime when the grain size is smaller than few diffusion lengths.