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Inhibited dark-line defect formation in strained InGaAs/AlGaAs quantum well lasers

✍ Scribed by Waters, R.G.; Bour, D.P.; Yellen, S.L.; Ruggieri, N.F.

Book ID: 119786041
Publisher: IEEE
Year: 1990
Tongue: English
Weight: 379 KB
Volume: 2
Category: Article
ISSN: 1041-1135
DOI: 10.1109/68.58039

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