Infrared Spectroscopic Study of Sputtered Tungsten Oxide Films

✍ Scribed by J-L. Paul; J-C. Lassègues

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 478 KB
• Volume: 106
• Category: Article
• ISSN: 0022-4596
• DOI: 10.1006/jssc.1993.1296

✦ Synopsis

Recent infrared and Raman spectroscopic studies of various tungsten oxide films concluded either the formation of (\mathrm{W}=\mathrm{O}) terminal bonds or the transformation of such bonds into (\mathrm{W}-\mathrm{OH}) groups upon proton insertion. The infrared transmission and reflection spectra of bleached and colored sputtered films were reinvestigated in order to resolve the previous contradictory interpretations and for better insight into the mechanism of electrochromism at the molecular level. The new results confirm the first interpretation and allow us to show that (\mathrm{H}^{+})or (\mathrm{Li}^{+})insertion creates shorter ( (\sim 1.7 \AA) ) and longer ((\sim 2 \AA) \mathrm{W}-\mathrm{O}) bonds around the (\mathrm{W}^{\mathrm{s}}) centers. These results are in agreement with the concepts of small polaron and of intervalence charge transfer mechanism. They illustrate the local lattice distortion around a (\mathrm{W}^{5+}) site. Ageing of the initial films has also been followed and characterized by H/D in situ isotopic exchange. 1993 Academic Press, Inc.