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Infrared reflectance study of 3C-SiC epilayers grown on silicon substrates

✍ Scribed by Dong, Lin; Sun, Guosheng; Zheng, Liu; Liu, Xingfang; Zhang, Feng; Yan, Guoguo; Zhao, Wanshun; Wang, Lei; Li, Xiguang; Wang, Zhanguo

No coin nor oath required. For personal study only.

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