✦ LIBER ✦

Infrared Reflectance Investigation of Undoped and Si-Doped GaN Films on Sapphire

✍ Scribed by Z.C. Feng; Y.T. Hou; M.F. Li; S.J. Chua; W. Wang; L. Zhu

Publisher: John Wiley and Sons
Year: 1999
Tongue: English
Weight: 133 KB
Volume: 216
Category: Article
ISSN: 0370-1972
DOI: 10.1002/(sici)1521-3951(199911)216:1<577::aid-pssb577>3.0.co;2-x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Infrared reflectance studies of GaN epit

Infrared reflectance studies of GaN epitaxial films on sapphire substrate

✍ Feng, Z. C.; Hou, Y. T.; Chua, S. J.; Li, M. F. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 107 KB 👁 2 views

Infrared reflectivity measurements were performed on undoped and Si-doped GaN films grown on sapphire. After analysing the substrate reflectance accurately, a good fit to the measured reflectance has been achieved. By comparison of the measured and calculated spectra, it becomes possible to identify

Investigations on the Optical Properties

Investigations on the Optical Properties of Undoped, Fluorine Doped and Antimony Doped Tin Oxide Films

✍ S. Shanthi; C. Subramanian; P. Ramasamy 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 163 KB 👁 2 views

Growth and Characterization of High Qual

Growth and Characterization of High Quality Continuous GaN Films on Si-Doped Cracked GaN Templates

✍ Chua, S.J. ;Hao, M. ;Zhang, J. ;Sia, E.K. 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 223 KB 👁 2 views