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Infrared, Raman, and X-Ray Diffraction Studies of Silicon Oxide Films Formed from SiH[sub 4] and N[sub 2]O Chemical Vapor Deposition

✍ Scribed by Nakamura, Minoru


Book ID
125330988
Publisher
The Electrochemical Society
Year
1985
Tongue
English
Weight
807 KB
Volume
132
Category
Article
ISSN
0013-4651

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