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Infrared microscopy as applied to failure analysis of P-DIP devices : Stephen H. Lewis. 24 a. Proc. IEEE Reliab. Phys. Symp., 99 (1986)

Publisher: Elsevier Science
Year: 1987
Tongue: English
Weight: 133 KB
Volume: 27
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(87)90495-1

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📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 131 KB