✦ LIBER ✦
Failure analysis and failure mechanisms of high voltage (530 V) gated diode crosspoint arrays : P. K. Tse, J. C. Gammel, D. G. Schimmel, W. H. Becker, J. P. Ballantyne and T. J. Riley. 24 a. Proc. IEEE Reliab. Phys. Symp., 120 (1986)
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 131 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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