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Infrared interference spectra observed in silicon epitaxial wafers

โœ Scribed by K. Sato; Y. Ishikawa; K. Sugawara

Publisher
Elsevier Science
Year
1966
Tongue
English
Weight
787 KB
Volume
9
Category
Article
ISSN
0038-1101

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The combustion of silicon based pyrotechnic compositions is observed with time resolved infrared spectrometry. This revealed the build up of strong emission at 9.1 + 0.1 /xm, which is associated with condensed silicon dioxide particulates. Time averaged spectra for compositions containing different