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Information reliability evaluation of a Ge2Sb2Te5-based phase change memory cell

✍ Scribed by Egarmin, K. N.; Voronkov, E. N.; Kozyukhin, S. A.

Book ID: 120661435
Publisher: SP MAIK Nauka/Interperiodica
Year: 2013
Tongue: English
Weight: 258 KB
Volume: 49
Category: Article
ISSN: 0020-1685
DOI: 10.1134/S0020168513090057

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