✦ LIBER ✦

Influences of circuit design on the characteristics of soft error in MOS dynamic RAMs

✍ Scribed by Tsutomu Yoshihara; Koichiro Mashiko; Satoshi Takano; Takao Nakano; Yasuji Nagayama

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Circuit design of dynamic MOS RAM with c

✍ Yasuji Nagayama; Masaki Kumanoya; Michihiro Yamada; Tsutomu Yoshihara; Makoto Ta 📂 Article 📅 1982 🏛 John Wiley and Sons 🌐 English ⚖ 697 KB

Circuit simulations of alpha-particle-in

✍ McPartland, R.J. 📂 Article 📅 1981 🏛 IEEE 🌐 English ⚖ 464 KB

Analysis of soft error in MOS dynamic RA

✍ Tsutomu Yoshihara; Satoshi Takano; Makoto Taniguchi; Hiroshi Harada; Takao Nakan 📂 Article 📅 1982 🏛 John Wiley and Sons 🌐 English ⚖ 315 KB

Influence of manufacturing errors on the

✍ Cheon, Gill-Jeong ;Parker, Robert G. 📂 Article 📅 2004 🏛 Springer-Verlag 🌐 Korean ⚖ 844 KB

Comparison of intrinsic gettering and ep

✍ Iwai, H.; Otsuka, H.; Matsumoto, Y.; Hisatomi, K.; Aoki, K. 📂 Article 📅 1984 🏛 IEEE 🌐 English ⚖ 265 KB

Comments on `A compact thermal noise mod

✍ Kolodziejski, J.F.; Spiralski, L. 📂 Article 📅 1990 🏛 IEEE 🌐 English ⚖ 117 KB