Influence of the measurement parameters on the reliability of ferroelectric thin films

✍ Scribed by Grossmann, M.; Lohse, O.; Bolten, D.; Boettger, U.; Waser, R.; Tiedke, S.; Schmitz, T.; Kall, U.; Kastner, M.; Schindler, G.; Hartner, W.

• Book ID: 121411505
• Publisher: Taylor and Francis Group
• Year: 2001
• Tongue: English
• Weight: 454 KB
• Volume: 32
• Category: Article
• ISSN: 1058-4587
• DOI: 10.1080/10584580108215672