Copper 2p,,, x-ray photoemission spectroscopy (XPS) measurements and near-edge x-ray absorption spectroscopy (NEXAFS) studies of copperdoped ZnO thin films were carried out in order to understand the role of the dopants in increasing the 6lm resistivity. c-Axis-oriented ZnO films (thickness 120 nm)
β¦ LIBER β¦
Influence of the isoelectronic dopants and of the excitation rate on the photoluminescence of GaP:(N, Bi)
β Scribed by Jiang Bingxi; Liu Xiao; Lin Xiuhua; Wang Naiguang; Chen Junde; Yang Sijun; Yie Lili
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 405 KB
- Volume
- 68
- Category
- Article
- ISSN
- 0038-1098
No coin nor oath required. For personal study only.
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