Influence of the calibration kit on the estimation of parasitic effects in HEMT devices at microwave frequencies

✍ Scribed by Miranda, J.M.; Fager, C.; Zirath, H.; Sakalas, P.; Munoz, S.; Sebastian, J.L.

• Book ID: 114629095
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 547 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2002.803077