𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Influence of tantalum and silver interlayers on thermal stress evolution in copper thin films on silicon substrates

✍ Scribed by T.K. Schmidt; T.J. Balk; G. Dehm; E. Arzt


Book ID
113894875
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
384 KB
Volume
50
Category
Article
ISSN
1359-6462

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES