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Influence of surface recombination on the burn-in effect in microwave GaInP/GaAs HBT's

✍ Scribed by Borgarino, M.; Plana, R.; Delage, S.L.; Fantini, F.; Graffeuil, J.

Book ID
114537511
Publisher
IEEE
Year
1999
Tongue
English
Weight
155 KB
Volume
46
Category
Article
ISSN
0018-9383

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πŸ“œ SIMILAR VOLUMES

[IEEE 1999 Symposium on High Performance
[IEEE 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO - London, UK (22-23 Nov. 1999)] 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401) - Investigation of the burn-in effect in microwave GaInP/GaAs HBTs by means of numerical simulations
✍ Rusani, A.; Kuchenbecker, J.; Norgarino, M.; Plana, R.; Graffeuil, J.; Vanzi, M. πŸ“‚ Article πŸ“… 1999 πŸ› IEEE βš– 616 KB