𝔖 Bobbio Scriptorium

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[IEEE 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO - London, UK (22-23 Nov. 1999)] 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401) - Investigation of the burn-in effect in microwave GaInP/GaAs HBTs by means of numerical simulations

✍ Scribed by Rusani, A.; Kuchenbecker, J.; Norgarino, M.; Plana, R.; Graffeuil, J.; Vanzi, M.

Book ID: 126638229
Publisher: IEEE
Year: 1999
Weight: 616 KB
Category: Article
ISBN-13: 9780780352988
DOI: 10.1109/EDMO.1999.821495

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