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Influence of structural defects on thermostability and radiation sensitivity of Si MOSFET dosimeters

✍ Scribed by V.A. Smyntyna; O.A. Kulinich; I.R. Iatsunskyi; I.A. Marchuk

Book ID
113872486
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
674 KB
Volume
46
Category
Article
ISSN
1350-4487

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