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Influence of stacking faults on the properties of GaN-based UV light-emitting diodes grown on non-polar substrates

✍ Scribed by C. Q. Chen; V. Adivarahan; M. Shatalov; M. E. Gaevski; E. Kuokstis; J. W. Yang; H. P. Maruska; Z. Gong; M. Asif Khan; R. Liu; A. Bell; F. A. Ponce

Publisher: John Wiley and Sons
Year: 2005
Tongue: English
Weight: 235 KB
Volume: 2
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200461547

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