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Influence of silicon X-ray photoelectron diffraction on quantitative surface analysis

✍ Scribed by L. Kubler; F. Lutz; J.L. Bischoff; D. Bolmont

Book ID
118364593
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
530 KB
Volume
251-252
Category
Article
ISSN
0039-6028

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The effects of photoelectron diffraction
The effects of photoelectron diffraction on quantitative X-ray photoelectron spectroscopy
✍ H. E. Bishop πŸ“‚ Article πŸ“… 1991 πŸ› John Wiley and Sons 🌐 English βš– 580 KB

## Abstract Although not discussed in most reviews of quantitative x‐ray photoelectron spectroscopy (XPS), diffraction of the photoelectrons leaving a single crystal can lead to potential errors of a factor of two or more in the calculated surface composition. A series of experimental measurements