Influence of pseudomorphic base-emitter spacer layers on current-induced degradation of beryllium-doped InGaAs/InAlAs heterojunction bipolar transistors

✍ Scribed by Kaiyan Zhang; Xiangkun Zhang; Bhattacharya, P.; Singh, J.

• Book ID: 114536342
• Publisher: IEEE
• Year: 1996
• Tongue: English
• Weight: 847 KB
• Volume: 43
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.477587