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Influence of postdeposition annealing on structural properties and electrical characteristics of thin Tm2O3 and Tm2Ti2O7 dielectrics

โœ Scribed by Tung-Ming Pan; Li-Chen Yen

Book ID
108064202
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
637 KB
Volume
256
Category
Article
ISSN
0169-4332

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