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Influence of layer thickness and primary ion on profile broadening during sputtering of Al0.5Ga0.5As/GaAs structures

โœ Scribed by M.K. Linnarsson; B.G. Svensson; Z.F. Paska; J. Borglind


Book ID
113285853
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
344 KB
Volume
85
Category
Article
ISSN
0168-583X

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