Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering

✍ Scribed by Min Dai, 代敏; Zhong Zhang, 张众; Jingtao Zhu, 朱京涛; Xiaoqiang Wang, 王晓强; Jing Xu, 徐敬; Xiuhua Fu, 付秀华; Liang Bai, 白亮; Qiushi Huang, 黄秋实; Zhanshan Wang, 王占山; Lingyan Chen, 陈玲燕

• Book ID: 115368403
• Publisher: Optics InfoBase
• Year: 2009
• Tongue: English
• Weight: 418 KB
• Volume: 7
• Category: Article
• ISSN: 1671-7694
• DOI: 10.3788/COL20090708.0738