Influence of injection rate on carrier lifetime degradation in p-type silicon irradiated by 4.5 MeV electrons

✍ Scribed by D. Bielle-Daspet; M. Pouget

• Book ID: 107833124
• Publisher: Elsevier Science
• Year: 1971
• Weight: 177 KB
• Volume: 93
• Category: Article
• ISSN: 0029-554X
• DOI: 10.1016/0029-554x(71)90065-6